Year

PhD Students /

Project results presented at international conferences

2012

A. Marin

Conference participation:

“Investigation of the surface chemistry of ITO / ITON thin films before and after N2 passivation” – E-MRS Spring Meeting, 12–14 May, Strasbourg, France

S. Preda

Conference participation:

“Structural characterization of ITO films obtained by rf sputtering method”, JVC-14/EVC-12/AMDVG-11/CroSloVM-19 Conference, 3–8 June, Dubrovnik, Croatia

H. Stroescu

“The stability of the ITO sputtering films by thermal treatment in N2 atmosphere”, 7th Workshop on Ellipsometry, 4–8 March, Leipzig, Germany

2013

H.Stroescu

Public dissertation defense:

“Advanced multifunctional materials based on oxides with special properties”, 29.10.2013  

2014

A. Marin

Public dissertation defense:

“Contributions for the study of nanostructured sistems by X-ray  photoelectron spectroscopy”, 19.09.2014

Training activity:

• 12.01-7.03.2015  Training for Bulgarian collaborators

(Institute of Solid State Physics of Bulgarian Academy, Sofia) on the Woollam M2000D ellipsometer purchased in the frame of FP7 project Research and Innovation Capacity Strengthening of ISSP-BAS in Multifunctional Nanostructures”-Part I

• 6-31.07.2015 Training for Bulgarian collaborators on the Woollam M2000D ellipsometer purchased in the frame of FP7 project Research and Innovation Capacity Strengthening of ISSP-BAS in Multifunctional Nanostructures”-Part II

Contribution to the conferences:

Institute of Solid State Physics, Sofia, Bulgaria, 26-29.10.2015

• oral presentation „Spectroscopic ellipsometry - a versatile tool for optical analysis of multi-layered thin films, surfaces and interfaces” at

 7th Jožef Stefan International Postgraduate School Students' Conference,May, 20 - 21, 2015

• “Solution-derived Ta₂O₅ high-K thin films for gate dielectric applications”

E-MRS 2015 Spring Meeting, May 11, 2015, Lille, France

Contribution to the conferences:

E-MRS 2015 Spring Meeting, May 11, 2015, Lille, France

• „Substrate influence on opto-electrical properties of p-type In-N co-doped ZnO thin films”

7^th edition of the workshop "Advanced optical and X-ray characterization techniques of multifunctional materials for information and communication technologies, sensing and renewable energy applications”, Section: TCO and solar cell applications September 16-18, 2015, Bucharest, , Romania

• “Substrate influence on opto-electrical properties of p-type In-N co-doped ZnO thin films”

E-MRS 2015 Spring Meeting, May 11, 2015, Lille, France:

• „A detailed comparison of Nb and V doped TiO₂ thin films prepared by the sol-gel  Method”
• „Substrate influence on opto-electrical properties of p-type In-N co-doped ZnO thin films”

8th Edition of symposium with international participation - New trends and strategies in the chemistry of advanced materials with relevance in biological systems, technique and environmental protectionJune, 4-5, 2015, Timisoara, Romania

• “Structure and properties of the TiO₂ based anostructures obtained by sol-gel and microwave assisted sol-gel methods”

EMRS-2015 Fall meeting, 15 - 18 September, 2015, Warsaw, Poland

• “Electrical properties of sol-gel TiO₂ multilayers films

 doped with transition metals”

VEIT2015- Nineteenth International Summer School on Vacuum, electron and ion Technologies,25 September 2015, Sozopol, Bulgaria

• Electrical properties of p-type In-N co-doped ZnO thin Films deposited on different substrates

7^th edition of the workshop "Advanced optical and X-ray characterization techniques of multifunctional materials for information and communication technologies, sensing and renewable energy applications”, Section: TCOand solar cell applications,September 16-18, 2015, Bucharest, Romania

• “TiO₂ based thin films obtained by sol-gel and microwaves assisted sol-gel methods”
• “Substrate influence on opto-electrical properties of p-type In-N co-doped ZnO thin films”
• “Influence of the substrate type on the microstructure of sol–gelfilms for optical and electrical applications
• „Infrared ellipsometry study of TCO thin films”,