"Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials"

Timetable June 25th



8:30-9:00Registration and poster setup
9:00-9:10Welcome note, Mariuca Gartner
9:10-9:30Opening speech: Vlad Popa, scientific director of Institute of Physical Chemistry
Session 1Chair: M.Zaharescu
9:30-9:45“NANOCHARM presentation", Maria Losurdo, Institute of Inorganic Methodologies and of Plasmas-IMIP-CNR, Bari, Italy
9:45-10:15“Exploiting spectroscopic ellipsometry as a real-time interactive diagnostic tool for todays’s plasmonic nanomaterials”, Maria Losurdo, Institute of Inorganic Methodologies and of Plasmas-IMIP-CNR, Bari, Italy, O1
10:15-10:45"Recent applications of nano-materials using Theta-theta & High power X- ray diffractometer", Paul Ulrich Pennartz, Channel Manager Europe - Rigaku Innovative Technologies, Osmic, O2
10:45-11:15Coffee break and poster presentation
Session 2Chair: M.Gartner
11:15-11:45"Spectroscopic Ellipsometry - Potenial for Metamaterials", Thomas Wagner, LOT ORIEL, Germany, O3
11:45-12:15"Applications of Spectroscopic Ellipsometry in Nano-Science and Nano-Technology", Roland Seitz, HORIBA Jobin Yvon, Germany,
12:15-12:45"Optical and microstructural properties of novel p-typed TCOs: theoretical and experimental studies", Mircea Modreanu, Tyndall National Institute-University College Cork, Ireland, O5
12:45-14:00Lunch and poster presentation
Session 3Chair: M.Losurdo
14:00-14:30“Analysis of 2D Si nanoparticle arrays by two-modulator generalized ellipsometry”, Oriol Arteaga, IN2UB, Departament de Física Aplicada i Òptica, Universitat de Barcelona, Spain, O6
14:30-14:45“Optical and structural properties of doped and un-doped ZnO thin films”, Aurelian Galca - National Institute for Materials Physics, Romania, O7
14:45-15:00“An ellipsometric study of some epiclon-based polyimide cross-linked Films”, Andreea Irina Cosutchi“Petru Poni” Institute of Macromolecular Chemistry – Iasi, Romania, O8
15:00-15:15“Elllipsometric and AFM characterization of CdxSe1-x MBE films”, Mihai Anastasescu, Institute of Physical Chemistry “Ilie Murgulescu” of Romanian Academy, Bucharest, Romania, O9
Experimental demonstration


Timetable June 26th



Session 4Chair: V.Fruth
9:30-10:00"At the interface nano/bio - biology or technology?", Madalin Enache, Institute of Biology, Center of Microbiology, Bucharest , Romania, O10
10:00-10:30"Microstructural high resolution X-ray metrology of nanocrystalline materials: Application to FCC metals embedded into a porous silicon matrix", Mihai Danila, INCD pentru Microtehnologie IMT Bucuresti, O11
10:30-11:00"Line profile analysis of alite doped with phosphorus solid solutions",Daniela Nastac, CEPROCIM S.A, Romania, O12
11:00-11:30Coffee break and poster presentation
Session 5Chair: M.Modreanu
11:30-12:00"Evaluation of thin film's density using SE and XRD measurements", Octavian Buiu - LOT ORIEL, Romania, O13
12:00-12:15"SE (in situ, in real time) and HRXRD as complementary methods in CdSe-QD's stacks characterization", Mariuca Gartner, Institute of Physical Chemistry "Ilie Murgulescu" of Romanian Academy, Bucharest, Romania, O14
12:30-12:45PANEL DISCUSSION
12:45-13:00AWARD CEREMONY and CLOSING REMARKS
13:00-14:00Lunch and poster presentation
Experimental demonstration

Organizing committee

Dr. M.Gartner
Dr. V.Fruth
Acad.Dr. M.Zaharescu
R. Scurtu
C. Andronescu
Dr. O. Buiu
Dr. M. Modreanu

LOT ORIEL

Rigaku-Cason