"Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials"

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Invitation

On the behalf of the organizers it is our pleasure to invite you to participate at the "Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials" workshop that will be organized by the Institute of Physical Chemistry “Ilie Murgulescu” of Romanian Academy, on 25-26th June 2009, Bucharest, Romania. This will be a good opportunity to review the recent advances in the area of nanostructured material characterization; both invited (30 min), regular contributions (15 min)and posters will be scheduled. We aim at encouraging the participation of young researchers (under 35 years old) working in the fields of spectroscopic ellipsometry and/or XRD; a best paper will be awarded (100 Euro).
Extended deadline of abstracts is May 15th, 2009.
Please send the registration form: Registration form

Participation is free of charge


Invited Companies:

J.A.Woollam Co-LOT-ORIEL
Horiba Jobin Yvon
Rigaku-CASON Engineering Plc.


Participation List

Click to download

Invited Lectures

  1. Maria Losurdo - Institute of Inorganic Methodologies and of Plasmas, IMIP-CNR, w/o Dept. of Chemistry - University of Bari, Italy.
  2. "Spectroscopic Ellipsometry - Potenial for Metamaterials", Thomas Wagner, LOT ORIEL, Germany.
  3. "Applications of Spectroscopic Ellipsometry in Nano-Science and Nano-Technology", Roland Seitz, HORIBA Jobin Yvon, Germany.
  4. "Recent applications of nano-materials using Theta-theta & High power X-ray diffractometer", Dr. Paul Ulrich Pennartz, Channel Manager Europe - Rigaku Innovative Technologies, Osmic.
  5. "Optical and microstructural properties of novel p-typed TCOs: theoretical and experimental studies", Mircea Modreanu, Tyndall National Institute-University College Cork, Ireland.
  6. "At the interface nano/bio - biology or technology?", Madalin Enache, Institute of Biology, Center of Microbiology, Bucharest , Romania.
  7. "Evaluation of thin film's density using SE and XRD measurements", Octavian Buiu - LOT ORIEL, Romania.
  8. "Microstructural high resolution X-ray metrology of nanocrystalline materials: Application to FCC metals embedded into a porous silicon matrix", Mihai Dănilă, Irina Kleps, Mihaela Miu, Tedora Ignat, Monica Simion - INCD pentru Microtehnologie IMT Bucuresti.
  9. "Line profile analysis of alite doped with phosphorus solid solutions", Daniela Nastac - CEPROCIM S.A, Romania.


Registration form


Template abstracts


Trip

We invite you to visit the Peles and Bran (Dracula) castles on Saturday - June 27th, 2009

Organizing committee

Institute of Physical Chemistry
Dr. M.Gartner
Dr. V.Fruth
M.C. .Dr. M.Zaharescu
Dr. R. Scurtu
C. Andronescu
Dr. O. Buiu
Dr. M. Modreanu

Asociaţia ALPHA

LOT ORIEL


Rigaku-Cason