Institute of Physical Chemistry

3rd International Workshop
"Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials"
Invitation
On the behalf of the organizers it is a great pleasure for me to invite you to participate at the 3rd edition of the international workshop organized by "Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania on September 15 - 16th 2011
This workshop will address the advanced multifunctional nanomaterial characterisation by ellipsometry, XRD and other complementary techniques. We aim to put together the communities of experimentalists, mainly materials scientist, chemists, physicists, engineers and theoreticians in order to share competences and come to a better description and predictability of the process in the various application areas.
The organizers invite participants to present their results, interact and share their knowledge and discuss actual and future research direction where they can collaborate.
Social program: We invite you to join us in the Danube Delta trip on Saturday 17th September.
Invited Companies:
J.A.Woollam Co-LOT-ORIEL
Rigaku-AMS 2000 Trading Impex SRL.
Timetable September 15th
8:30-8:50 | Registration and poster setup |
9:00-9:10 | Welcome note, Dr. Mariuca Gartner |
9:10-9:20 | Opening speech: Dr. Vlad Popa, scientific director of Institute of Physical Chemistry |
Session 1 | Chair: Dr. Octavian Buiu |
9:20-9:50 | Prof. Olivier Durand "Interpretation of the two-components observed in high resolution X-ray diffraction ω scan peaks from mosaic thin films: case of both PLD-grown ZnO on c-sapphire substrate and MBE-grown GaP on silicon substrate", Université Européenne de Bretagne, INSA, FOTON, France. |
9:50-10:20 | Dr. Mircea Modreanu "Advanced optical characterisation of metal oxides thin films", Tyndall National Institute, University College Cork, Ireland. |
10:20-10:40 | Dr.Keisuke Saito, "Modern methods of analyzing the structure of material science", Marketing Manager XRD Rigaku Company, Japan. |
10:40-11:00 | Claudia Gavrilescu, "Qualitative analysis followed by Semi-quantitative analysis (SQX analysis) of powder sample - Bauxite Sierra Leone?- AMS 2000-Rigaku representative Analytical Division, Bucharest, Romania. |
11:00-11:30 | Coffee break & poster presentation |
Session 2 | Chair: Dr. Olivier Durand |
11:30-11:55 | Dr.Anna Szekeres, "Ellipsometric characterization of SiOxNy formed in Si surface layer modified by plasma- immersion N+ ion implantation", Institute of Solid State Physics Sofia, Bulgaria. |
11:55-12:20 | Prof. Dr. Octavian Buiu, "Errors associated with spectroellipsometric data analysis", Lot-Oriel Company, Bucharest, Romania. |
12:20-12:45 | Dr. Carmen Moldovan, "Characterization of self- assembled monolayers (SAMs) on silicon substrate comparative with polymer substrate for E- coli O157:H7 detection", IMT-Bucharest, Romania. |
12:45-13:45 | Lunch and poster presentation |
Session 3 | Chair: Dr. Mircea Modreanu |
13:45-14:10 | Dr. Macovei, "Mn Environment in Mn-Ge Ferromagnetic Thin Films, Studied by EXAFS Spectroscopy", National Institute of Materials Physics, RO - 077125, Magurele-Bucharest, Romania. |
14:10-14:35 | Dr. Daniela Nastac, "Structural characterization of amorphous phase and nanomaterials used as building materials", CEPROCIM S.A., Bucharest, Romania. |
Experimental demonstration of Ellipsometry and XRD |
Timetable September 16th
Session 4 | Chair: Dr.Anna Szekeres |
9:30-9:55 | Dr. Mihai Danila, "X-Ray Investigations-Methods, Conditions, Limits and Applications in the study of nanostructured materials and Semiconductors Metrology", IMT-Bucharest, Romania. |
9:55-10:20 | Dr. Aurelian Galca, "Highly oriented aluminum nitride thin films synthesized by reactive RF magnetron sputtering at low temperature", National Institute of Materials Physics, RO - 077125, Magurele-Bucharest, Romania. |
10:20-10:45 | Dr. M.Anastasescu, "Microstructure and Optical Properties of Sol-Gel BaTi0.85Zr0.15O3", "Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania. |
10:45-11:15 | Coffee break & poster presentation |
Session 5 | Chair: Dr.Maria Zaharescu |
11:15-11:35 | Dr. Jose Maria Calderon, "XRD and Raman spectroscopy of zirconia and ceria based fluorite type solid solutions doped with rare-earths", "Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania. |
11:35-12:00 | Ph.D Carmen Steluta Ciobanu, "XRD study of europium doped hydroxyapatite powders", University Politehnica of Bucharest, Faculty of Applied Chemistry and Materials Science, Department of Science and Engineering of Oxide Materials and Nanomaterials, Bucharest, Romania. |
12:00-12:35 | Ph.D Liviu Marian Duta, "In vivo osseointegration of highly adherent hydroxyapatite thin films synthesized by PLD onto cranioplasty titanium mesh implants", Laser Department, National Institute for Laser, Plasma and Radiation Physics, Bucharest, Romania. |
12:35-13:00 | Dr. Victor Kuncser, "Faraday cell based magneto-optic Kerr effect magnetometry: principles and applications to magnetic thin films and multilayers", National Institute of Materials Physics, RO - 077125, Magurele-Bucharest, Romania. |
POSTER PRESENTATIONS |
- Ph.D. Manuela-Tatiana Nistor, "Investigation upon sensitive compounds structures through modern techniques" , "Petru Poni" Institute of Macromolecular Chemistry Iasi, Romania
- Dr. Madalina Nicolescu, "Structural and optical properties of aluminum doped ZnO thin films by magnetron sputtering", "Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania
- Ph.D. Nicoleta Dulgheru, "Characterization of thin Ge-Sb(As)-S-Te-film by spectroscopic ellipsometry", "Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania
- Ph.D. Valentin Ion, "Optical properties for the biocompatible polymers thin films obtained by laser evaporation", National Institute for Laser, Plasma and Radiation Physics, RO-077125, Magurele, Bucharest, Romania
- Ph.D. Hermine Stroescu, "Optical and morphological characterization of ITO and ITON films deposited on Si substrate by rf magnetron sputtering", "Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania
- Dr. Mihai Stoica, "Infrared behavior of ZnSeTe materials determined by ellipsometry","Ilie Murgulescu" Institute of Physical Chemistry, Romanian Academy, Bucharest, Romania.