Seminar Ellipsometry

2^nd International Workshop
"Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials"

Invitation

On the behalf of the organizers it is a great pleasure to invite you to participate at the 2nd edition of "Current trends and advanced ellipsometric and XRD techniques for the characterization of nanostructured materials" workshop that will be organized by the Institute of Physical Chemistry “Ilie Murgulescu” of Romanian Academy, Bucharest, Romania on September 16-17th 2010. This will be a good opportunity to review the recent advances in the area of nanostructured material characterization; both invited (30 min), regular contributions (15 min) and posters will be scheduled.

Deadline: Please, announce your participation until April 15th 2010, filling the Registration form

The workshop program will be announced on the workshop website on May 15th 2010 May 15th 2010.

Registration: We intend to keep the free charge participation.

Proceedings: Revue Roumaine de Chimie - Romanian Journal of Chemistry edited by the Romanian Academy.

Social program: a trip to the Danube Delta will be organized on 18th September 2010.